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Data Analysis Principles
HP 81200 Data Generator/Analyzer Platform User Guide, Revision 2.1
Data Analysis Principles
The system provides four test and measurement modes.
"Functional Tests"
"Error Analysis and Marginal Tests" on page 44
"Display of Test Results" on page 44
Functional Tests
The functional tests include:
• Capture Data mode:
Captures data until the memory is filled. You can view the result in a
state list and also graphically. Every analyzer can capture up to 1 Mbit of
data.
• Bit Error Rate Measurement mode:
The Bit Error Rate Measurement mode scans the received data in real
time and shows the resulting actual and accumulated number of bits, the
actual and accumulated number of errors, and the actual and
accumulated bit error rate.
The display is updated every second.
• Compare and Acquire around Error mode:
The Compare and Acquire around Error mode acquires data in real time.
The memory capacity is 64 K words. The word length (and hence the
number of captured bits) depends on the chosen blocklength granularity
or multiplying factor, respectively. It can be 1 to 16 bits.
If an error occurs, it is possible to define when the system should stop
after the occurrence of the error. The range to stop can be set from
608 bits up to 64 Kbit * blocklength granularity after an error has
occurred.
The received data with the errors can be viewed as a state error list and
also graphically with the Waveform Viewer.
It is possible to load expected data segments, which may have been
captured from a reference device or imported from a simulation.
Real-time compare up to 330 MHz can be achieved with single-ended
analyzer frontends. Real-time compare up to 165 MHz can be achieved
with dual-input analyzer frontends.
Introduction to the System
43
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