Error Analysis And Marginal Tests; Display Of Test Results; Summary Of Analysis-Related Terms - HP 81200 User Manual

Data generator/analyzer platform
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Introduction to the System
Error State Display:
Waveform Viewer:
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• Compare and Capture mode:
The Compare and Capture mode captures data until the sequence
expires or the Stop button is pressed. This mode is intended to be used
with event handling where the reaction to an error is determined by the
sequence.
You can view the result in a state list where errors are highlighted and
also graphically with the Waveform Viewer.

Error Analysis and Marginal Tests

A device can be stimulated with arbitrary input signals using the variable
pulse parameters provided by the HP 81200 system.
Parameters include levels, delay and width and can be varied
independently for each channel or for a DUT port as a whole.
Distorted signals can be emulated using the channel addition capability of
the HP 81200 system, as well as glitches and pulse delay variations. Up to
4 channels can be added to emulate a real-time pulse delay variation with
up to 4 phases.

Display of Test Results

The results of a bit error rate measurement are displayed in the Bit Error
Rate Display.
• The Bit Error Rate Display shows the current and accumulated results
and is continuously updated.
Captured data and the results of real-time compare tests can be
investigated with the Error State Display and the Waveform Viewer.
• The Error State Display shows the captured data and errors in tabular
form. Auxiliary functions are provided that support quick navigation.
• The Waveform Viewer shows the captured data and errors in graphical
form. It provides waveform selection as well as markers and zoom for
precise waveform analysis.

Summary of Analysis-Related Terms

BER:
Bit Error Rate.
Shows captured data and errors in tabular form.
Shows captured data and errors in graphical form.
HP 81200 Data Generator/Analyzer Platform User Guide, Revision 2.1
Data Analysis Principles

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