Height Measurement - Zeiss Axioskop 2 FS plus Manual

Carl Zeiss
1
Fig. 3-26 Length measurement using scale 1
on the stage micrometer (object)
and scale 2 on the crossline
micrometer (eyepiece)
3.5.2

Height measurement

Height measurements using the microscope are always possible to be performed if both the lower and
upper side of the specimen can be focused. This should preferably be performed using a precision
focusing drive and a high-aperture objective with a low depth of focus.
The difference in the height of the objective slider results in a height value for transmitted-light
specimens which is falsified by the refractive index of the specimen (through which focusing was made)
and perhaps by the immersion oil. The correct height value d of the specimen measured in transmitted
light results from the difference of height adjustments (focus difference) d' and the refractive indices n
of the specimen and n
n
P
d = d' x
n
M
3-38
Quantitative microscopy
2
of the medium between cover slip and specimen:
M
OPERATION
After exchange of the stage micrometer for the
specimen to be measured, the measuring distance
of interest results from the number of increments
of the crossline micrometer (tenth estimated),
multiplied by the scale value k'. Example:
L = 35.5 x 9.9 µm = 351.5 µm
Particularly large object structures can also be
determined by using the vernier scale gradations
(0.1 mm) on the mechanical stage. Here, it might
be necessary to determine the distance to be
measured through calculation from a combined x
and y measurement (Pythagoras).
Axioskop 2 FS plus
Axioskop 2 FS
MOT
P
B 40-076 e 02/01