Dts1 Dielectric Test Sample Box; Frequency Domain Spectroscopy (Fds); Polarization Current Method (Pdc) - Omicron Lab SPECTANO 100 User Manual

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SPECTANO 100 User Manual
5.3

DTS1 dielectric test sample box

5.4

Frequency domain spectroscopy (FDS)

5.5

Polarization current method (PDC)

12
The DTS1 dielectric test sample box is an accessory to SPECTANO 100 for
demonstrating and testing the functionality of SPECTANO 100 without a sample
test cell. The DTS1 is a demo box containing two samples: a high-precision,
low-loss 1 nF capacitor and a RC circuit simulating a dielectric sample with
losses. The main application areas of the DTS1 are in training and
demonstration purposes but it can also be used for detecting errors in a cable
setup.
By using the frequency domain spectroscopy (FDS), the dielectric properties of
the solid or liquid material under test are measured by frequency sweep (3 μHz
to 5 kHz). The FDS allows fast measurements at high frequencies but requires
long measurement times at lower frequencies.
In the polarization current (PDC) method, a DC voltage is applied to the device
under test for a specific time and the polarization current is measured. From the
c time and the polarization curren
polarization current, the dielectric response is evaluated and the dielectric
the dielectric res
frequency characteristic is calculated using Fourier transformation. The PDC
cteristic is
c is calculated using Fouri
method is faster than the FDS at very low frequencies, but the upper frequency
er than the FDS at ve
er than the FDS at very
is limited due to the finite rise time of the DC pulse. The test frequency range for
e to the finite rise time of the DC
o the finite rise time of
the PDC method is 20 μHz to 100 mHz.
method is 20 μHz to 100 mHz.
od is 20 μHz to 100
FDS), the dielectric properties o
asured by frequency sweep (3 μ
ments at high frequencies but req
uencies.
thod (PDC)
d (PDC)
t (PDC) method, a DC voltage is
) method, a DC vol
d the polarization c
electric re ponse is evalu
se is evalu
calculated using
low frequ
cision,
ple with
nd
errors in a cable
n a cable
DS
DS)
dielectric prop
d by frequency swe
t high frequencies
ample

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