Description of instrument
1
Description of instrument
1.1
Description
Designation:
Model:
Type:
1.2
Function
X-rays excite the atoms of the sample, causing them to emit radiation. This
radiation is measured by a semiconductor detector.
The instrument comes with a preset method of analysis installed. Data are already
stored in the instrument's memory. The measured values are compared with these
data. After the measurement is complete, the results for an unknown sample are
displayed on the screen.
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SPECTRO MIDEX
MID05
76004855
SPECTRO MIDEX — 05.10.2017