Ir (Sample Rate); Ic (Dio Change Detect) - Digi XBee3 DigiMesh 2.4 User Manual

AT commands

IR (Sample Rate)

Determines the I/O sample rate used to generate outgoing I/O sample data. When the IR value is
greater than 0, the device samples and transmits all enabled digital I/O and ADCs every IR
milliseconds. I/O Samples transmit to the address specified by DH +DL.
At least one I/O line must be configured as an input or explicit output for samples to be generated.
Parameter range
0, 0x32 - 0xFFFF (ms)
Default
0

IC (DIO Change Detect)

Set or read the digital I/O pins to monitor for changes in the I/O state.
IC works with the individual pin configuration commands (D0 - D9, P0 - P4). If the device detects a
change on an enabled digital I/O pin, it immediately transmits a digital I/O sample to the address
specified by DH + DL. If sleep is enabled, the edge transition must occur during a wake period to
trigger a change detect.
The data transmission contains only DIO data.
IC is a bitmask you can use to enable or disable edge detection on individual digital I/O lines. Only
DIO0 through DIO14 can be sampled using a Change Detect.
Set unused bits to 0.
Bit field
Bit I/O line
0 DIO0
1 DIO1
2 DIO2
3 DIO3
4 DIO4
5 DIO5
6 DIO6
7 DIO7
8 DIO8
9 DIO9
10 DIO10
11 DIO11
12 DIO12
Digi XBee3® DigiMesh 2.4 RF Module User Guide
Micro pin Surface-mount pin
31 33
30 32
29 31
28 30
23 24
26 28
27 29
24 25
9 10
25 26
7 7
8 8
5 5
I/O sampling commands
Through-hole pin
20
19
18
17
11
15
16
12
9
13
6
7
4
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