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Model 5528A
Parallelism
Measurements
CONTENTS
SECTION 14
PARALLELISM MEASUREMENTS
INTRODUCTION
HARDWARE REQUIRED
REFERENCE MATERIAL
LINEAR PARALLELISM
MEASUREMENTS
ROTATIONAL PARALLEl
iSM MEASUREMENTS
INTRODUCTION
There
are
two
types
of
" Parallelism"
measurements
-
"linear" and "Rotational
"
.
In
any
Parallelism measurement
,
you
compare
the
slopes of
two
Straightness
measurement, measured
from
the same
Straightness
Reflector
positon
.
A "linear
Parallelism
"
measurement consists of two Straightness
measurements,
made along
th
e
same
measurement
axis but with the
Interferometer
moving in
the
one
measurement
and
th
e
Reflector moving in the
other
measurement.
A
"
Rotationa
l
Para llelism" measurement
is made on a
lathe. It
co nsists
of
two
Straightness
measurements,
ea
ch
made with
the Reflector held in
the
lathe's
spindle
(the workpiece
location
),
but
with the spindle
rotated
180 degrees for the
second
measurement.
HARDWARE REQUIRED
In
addition to
the
hardware
required for
any
measurement
using
the Laser Measurement System
(see Figure
4-
1),
any
Parallelism
measurement will need all the same
hardware
as required
for a
Straightness measurement,
plu
s
a Turning Mirror and possibly a
Straightness Retroreflector.
REFERENCE MATERIAL
Physical
Setup of the Laser
Head
and
Tripod
Section 4
Interconnections,
Turn-on
.
..................
,
..
,
...
,.................
Section
5
Straightness Measurement
s
(Along a
Horizontal
Axis
)
.
........
.
...
.
.... Section
10
Straightness
Measurement
s
(Using
the
Straightness
Retroreflector
)
...... Section
11
Ali gnment Techniques
..
.
...........
.
...
.
Section 15
LINEAR PARALLELISM MEASUREMENTS
With
this
type of Parallelism
measurement,
you will make
two
Straightness Measurements along
the same measurement axi
s.
In
one measurement the Reflector will
mo
ve and in the other the
Interferometer
will
mo
ve.
14-1
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