Weak End Infeed Logic; Completing The Test - ABB RET670 Commissioning Manual

1MRK 504 165-UEN A
11.11.3.2
11.11.3.3
Transformer protection RET670 2.2 IEC
Commissioning manual
Testing functionality by secondary injection
longer than the carrier accelerated trip (TRIP) recorded for the permissive
overreach scheme communication.
5. Restore the forward and reverse zone timer to its original setting.

Weak end infeed logic

Weak-end infeed logic at permissive overreach schemes
1. Check the blocking of the echo with the injection of a CRL signal >40ms
after a reverse fault is applied.
2. Measure the duration of the echoed CS signal by applying a CRL receive
signal.
3. Check the trip functions and the voltage level for trip by reducing a phase
voltage and applying a CRL receive signal.
Testing conditions
Only one type of fault is sufficient, with the current reversal and weak-end infeed
logic for distance protection function ZCRWPSCH. Apply three faults (one in each
phase). For phase L1-N fault, set these parameters:
Table 38: Phase L1-N parameter values
Phase I (Amps)
L1 0
L2 0
L3 0
If wanted, change all settings cyclically for other faults (L2-N and L3-N).
The setting parameter WEI is set to Echo & Trip.
1. Apply input signals according Table 38.
2. Activate the receive (CR) signal.
3. After the IED has operated, turn off the input signals.
4. Check that trip, send signal, and indication are obtained.
The ECHO output gives only a 200 ms pulse.

Completing the test

Continue to test another function or end the test by changing the TESTMODE
setting to Off. Restore connections and settings to their original values, if they were
changed for testing purposes.
Phase-angle (Deg) V (Volts)
0 Set less than
240 63
120 63
Section 11
M14947-37 v2
M14947-39 v5
M14947-52 v7
Phase-angle (Deg)
UPN<
0
240
120
M14947-105 v5
253