Table Of Contents - Keithley Series 2600 Application Manual

Section 1 General Information
1.1 Introduction . . . . . . . . . . . . . . . . . . . . . .1-1
1.2 Hardware Configuration . . . . . . . . . . . . . . .1-1
1 .2 . 1 System Configuration . . . . . . . . . . . . .1-1
1 .2 .2 Remote/Local Sensing Considerations . . . . .1-2
1.3 Graphing . . . . . . . . . . . . . . . . . . . . . . . .1-2
Section 2 Two-terminal Device Tests
2.1 Introduction . . . . . . . . . . . . . . . . . . . . . .2-1
2.2 Instrument Connections . . . . . . . . . . . . . . .2-1
2.3 Voltage Coefficient Tests of Resistors . . . . . . . .2-1
2 . 3 . 1 Test Configuration . . . . . . . . . . . . . . .2-1
2 . 3 .2 Voltage Coefficient Calculations . . . . . . . .2-1
2 . 3 . 3 Measurement Considerations . . . . . . . . .2-2
2 . 3 . 4 Example Program 1:
Voltage Coefficient Test . . . . . . . . . . . .2-2
2 . 3 . 5 Typical Program 1 Results . . . . . . . . . . .2-3
2 . 3 . 6 Program 1 Description . . . . . . . . . . . . .2-3
2.4 Capacitor Leakage Test . . . . . . . . . . . . . . . .2-3
2 . 4 . 1 Test Configuration . . . . . . . . . . . . . . .2-3
2 . 4 .2 Leakage Resistance Calculations . . . . . . . .2-3
2 . 4 . 3 Measurement Considerations . . . . . . . . .2-4
2 . 4 . 4 Example Program 2:
Capacitor Leakage Test . . . . . . . . . . . . .2-4
2 . 4 . 5 Typical Program 2 Results . . . . . . . . . . .2-4
2 . 4 . 6 Program 2 Description . . . . . . . . . . . . .2-5
2.5 Diode Characterization . . . . . . . . . . . . . . . .2-5
2 . 5 . 1 Test Configuration . . . . . . . . . . . . . . .2-5
2 . 5 .2 Measurement Considerations . . . . . . . . .2-5
2 . 5 . 3 Example Program 3:
Diode Characterization . . . . . . . . . . . .2-5
2 . 5 . 4 Typical Program 3 Results . . . . . . . . . . .2-6
2 . 5 . 5 Program 3 Description . . . . . . . . . . . . .2-6
2 . 5 . 6 Using Log Sweeps . . . . . . . . . . . . . . .2-7
2 . 5 . 7 Using Pulsed Sweeps . . . . . . . . . . . . . .2-7
Section 3 Bipolar Transistor Tests
3.1 Introduction . . . . . . . . . . . . . . . . . . . . . 3-1
3.2 Instrument Connections . . . . . . . . . . . . . . 3-1

Table of Contents

3.3 Common-Emitter Characteristics . . . . . . . . . 3-1
3 . 3 . 1 Test Configuration . . . . . . . . . . . . . . 3-2
3 . 3 .2 Measurement Considerations . . . . . . . . 3-2
3 . 3 . 3 Example Program 4:
Common-Emitter Characteristics . . . . . . 3-2
3 . 3 . 4 Typical Program 4 Results . . . . . . . . . . 3-3
3 . 3 . 5 Program 4 Description . . . . . . . . . . . . 3-3
3.4 Gummel Plot . . . . . . . . . . . . . . . . . . . . 3-3
3 . 4 . 1 Test Configuration . . . . . . . . . . . . . . 3-3
3 . 4 .2 Measurement Considerations . . . . . . . . 3-4
3 . 4 . 3 Example Program 5: Gummel Plot . . . . . . 3-4
3 . 4 . 4 Typical Program 5 Results . . . . . . . . . . 3-5
3 . 4 . 5 Program 5 Description . . . . . . . . . . . . 3-5
3.5 Current Gain . . . . . . . . . . . . . . . . . . . . 3-6
3 . 5 . 1 Gain Calculations . . . . . . . . . . . . . . 3-6
3 . 5 .2 Test Configuration for Search Method . . . . 3-6
3 . 5 . 3 Measurement Considerations . . . . . . . . 3-6
3 . 5 . 4 Example Program 6A: DC Current Gain
Using Search Method . . . . . . . . . . . . . 3-6
3 . 5 . 5 Typical Program 6A Results . . . . . . . . . 3-7
3 . 5 . 6 Program 6A Description . . . . . . . . . . . 3-7
3 . 5 . 7 Modifying Program 6A . . . . . . . . . . . . 3-7
3 . 5 .8 Configuration for Fast Current Gain Tests . . 3-8
3 . 5 . 9 Example Program 6B: DC Current Gain
Using Fast Method . . . . . . . . . . . . . . 3-8
3 . 5 . 1 0 Program 6B Description . . . . . . . . . . . 3-9
3 . 5 . 1 1 Example Program 7: AC Current Gain . . . . 3-9
3 . 5 . 1 3 Typical Program 7 Results . . . . . . . . . . 3-10
3 . 5 . 1 4 Program 7 Description . . . . . . . . . . . . 3-10
3 . 5 . 1 5 Modifying Program 7 . . . . . . . . . . . . . 3-10
3.6 Transistor Leakage Current . . . . . . . . . . . . 3-10
3 . 6 . 1 Test Configuration . . . . . . . . . . . . . . 3-10
3 . 6 .2 Example Program 8: I
3 . 6 . 3 Typical Program 8 Results . . . . . . . . . . 3-11
3 . 6 . 4 Program 8 Description . . . . . . . . . . . . 3-11
3 . 6 . 5 Modifying Program 8 . . . . . . . . . . . . . 3-12
Section 4 FET Tests
4.1 Introduction . . . . . . . . . . . . . . . . . . . . . 4-1
4.2 Instrument Connections . . . . . . . . . . . . . . 4-1
Test . . . . . . . . 3-11
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