Program 3C. Diode Characterization Pulsed Sweep - Keithley Series 2600 Application Manual

System sourcemeter instruments semiconductor device test
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APPenDIx A
Scripts
--Print Data to output queue
--Local Variables
local l_points = points
local l_volt = volt
local l_curr = curr
print("Voltage Data (V):")
for l_i = 1, l_points
print(l_volt[l_i])
end
print("")
print("Source Current Data (A):")
for l_i = 1, l_points
print(l_curr[l_i])
end
end --function Print_Data()
--Diode_Fwd_Chr_Log()

Program 3C. Diode Characterization Pulsed Sweep

--[[
Diode_Fwd_Char_Pulse(): USES TABLES
This program performs a forward characterization test on a diode using a pulsed source and
prints data. The default is a 50% duty cycle (i.e., ton = toff)
Required equipment:
(1) Single-channel Keithley Series 2600 System SourceMeter instrument
(1) Silicon diode or equivalent
Running this script creates functions that can be used to measure the IV characteristics
of diodes.
The functions created are:
1. Diode_Fwd_Char_Pulse(ilevel, start, stop, ton, toff, steps) --Default values ilevel =
0s, start =
10ms,
--toff = 10ms, steps = 10
2. Print_Data(steps,volt,curr)
See detailed information listed in individual functions
A-14
do
do
--1ma, stop = 10ma, ton =

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