Program 8 . Transistor Leakage (Iceo - Keithley Series 2600 Application Manual

System sourcemeter instruments semiconductor device test
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end --function Check_Comp()
--AC_Gain()
Program 8. Transistor Leakage (ICeo)
--[[
Iceo(): USES TABLES
This program sweeps the voltage on the collector/emitter (VCE) of a BJT with an open base.
The VCEO and ICEO values are then printed.
Required equipment:
(1) Single-channel Keithley Series 2600 System SourceMeter instrument
(1) 2N3904NPN transistor
Running this script creates functions that can be used to measure open base voltage and
current characteristics of transistors. The default values are for an NPN transistor type
2N3904.
The functions created are:
1. Iceo(vstart, vstop, vsteps)
--Default values vstart = 0V, vstop = 10V, vsteps = 100
2. Print_Data(vsteps, ce_volt,ce_curr)
See detailed information listed in individual functions.
1) From Test Script Builder
- At the TSP> prompt in the Instrument Control Panel, type Vceo()
2) From an external program
- Send the entire program text as a string using standard GPIB Write calls.
Rev1: JAC 6.12.2007
]]--
------------------ Keithley TSP Function ------------------
function Iceo(vstart, vstop, vsteps) --Configure SMUA to perform a voltage
--sweep from start to stop in a user-defined number on the collector/emitter of a BJT with
an open base. The collector --current (Iceo) is measured at each voltage value.
--Returns programmed voltage and measured current values.
APPenDIx A
Scripts
A-39

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