Keithley Series 2600 Application Manual page 3

4.3 Common-Source Characteristics . . . . . . . . . 4-1
4 . 3 . 1 Test Configuration . . . . . . . . . . . . . . 4-1
4 . 3 .2 Example Program 9: Common-Source
Characteristics . . . . . . . . . . . . . . . . 4-1
4 . 3 . 3 Typical Program 9 Results . . . . . . . . . . 4-2
4 . 3 . 4 Program 9 Description . . . . . . . . . . . . 4-2
4 . 3 . 5 Modifying Program 9 . . . . . . . . . . . . . 4-3
4.4 Transconductance Tests . . . . . . . . . . . . . . 4-3
4 . 4 . 1 Test Configuration . . . . . . . . . . . . . . 4-3
4 . 4 .2 Example Program 10: Transconductance
vs . Gate Voltage Test . . . . . . . . . . . . . 4-4
4 . 4 . 3 Typical Program 10 Results . . . . . . . . . 4-5
4 . 4 . 4 Program 10 Description . . . . . . . . . . . 4-5
4.5 Threshold Tests . . . . . . . . . . . . . . . . . . . 4-6
4 . 5 . 1 Search Method Test Configuration . . . . . . 4-6
4 . 5 .2 Example Program 11A: Threshold Voltage
Tests Using Search Method . . . . . . . . . . 4-6
4 . 5 . 3 Program 11A Description . . . . . . . . . . 4-7
4 . 5 . 4 Modifying Program 11A . . . . . . . . . . . 4-7
4 . 5 . 5 Self-bias Threshold Test Configuration . . . 4-7
4 . 5 . 6 Example Program 11B: Self-bias
Threshold Voltage Tests . . . . . . . . . . . 4-8
4 . 5 . 7 Program 11B Description . . . . . . . . . . 4-9
4 . 5 .8 Modifying Program 11B . . . . . . . . . . . 4-9
Section 5 Using Substrate Bias
5.1 Introduction . . . . . . . . . . . . . . . . . . . . . 5-1
5.2 Substrate Bias Instrument Connections . . . . . 5-1
5 .2 . 1 Source-Measure Unit Substrate Bias
Connections and Setup . . . . . . . . . . . 5-1
5 .2 .2 Voltage Source Substrate Bias Connections . 5-2
5.3 Source-Measure Unit Substrate Biasing . . . . . 5-2
5 . 3 . 1 Program 12 Test Configuration . . . . . . . 5-2
5 . 3 .2 Example Program 12: Substrate Current
vs . Gate-Source Voltage . . . . . . . . . . . 5-2
5 . 3 . 3 Typical Program 12 Results . . . . . . . . . 5-4
5 . 3 . 4 Program 12 Description . . . . . . . . . . . 5-4
5 . 3 . 5 Modifying Program 12 . . . . . . . . . . . . 5-5
5 . 3 . 6 Program 13 Test Configuration . . . . . . . 5-5
5 . 3 . 7 Example Program 13: Common-Source
Characteristics with Source-Measure Unit
Substrate Bias . . . . . . . . . . . . . . . . 5-5
5 . 3 .8 Typical Program 13 Results . . . . . . . . . 5-7
5 . 3 . 9 Program 13 Description . . . . . . . . . . . 5-7
5 . 3 . 1 0 Modifying Program 13 . . . . . . . . . . . . 5-7
5.4 BJT Substrate Biasing . . . . . . . . . . . . . . . . 5-7
5 . 4 . 1 Program 14 Test Configuration . . . . . . . 5-7
5 . 4 .2 Example Program 14: Common-Emitter
Characteristics with a Substrate Bias . . . . 5-7
5 . 4 . 3 Typical Program 14 Results . . . . . . . . . . 5-9
5 . 4 . 4 Program 14 Description . . . . . . . . . . . 5-9
5 . 4 . 5 Modifying Program 14 . . . . . . . . . . . . 5-10
Section 6 High Power Tests
6.1 Introduction . . . . . . . . . . . . . . . . . . . . . 6-1
6 . 1 . 1 Program 15 Test Configuration . . . . . . . 6-1
6 . 1 .2 Example Program 15: High Current
Source and Voltage Measure . . . . . . . . . 6-1
6 . 1 . 3 Program 15 Description . . . . . . . . . . . 6-2
6.2 Instrument Connections . . . . . . . . . . . . . . 6-2
6 .2 . 1 Program 16 Test Configuration . . . . . . . 6-2
6 .2 .2 Example Program 16: High Voltage
Source and Current Measure . . . . . . . . 6-2
6 .2 . 3 Program 16 Description . . . . . . . . . . . 6-3
Appendix A Scripts
Section 2. Two-Terminal Devices . . . . . . . . . . . . . A-1
Program 1 . Voltage Coefficient of Resistors . . . . . A-1
Program 2 . Capacitor Leakage Test . . . . . . . . . A-5
Program 3 . Diode Characterization . . . . . . . . . A-8
Program 3A . Diode Characterization Linear Sweep . A-8
Program 3B . Diode Characterization Log Sweep . . A-11
Program 3C . Diode Characterization Pulsed Sweep . A-14
Section 3. Bipolar Transistor Tests . . . . . . . . . . . . A-19
Program 4 . Common-Emitter Characteristics . . . . A-19
Program 5 . Gummel Plot . . . . . . . . . . . . . . . A-24
Section 6. High Power Tests . . . . . . . . . . . . . . . . A-28
Program 6 . Current Gain . . . . . . . . . . . . . . . A-28
Program 6A . Current Gain (Search Method) . . . . . A-28
Program 6B . Current Gain (Fast Method) . . . . . . A-32
Program 7 . AC Current Gain . . . . . . . . . . . . . A-36
Program 8 . Transistor Leakage (ICEO) . . . . . . . . A-39
Section 4. FET Tests . . . . . . . . . . . . . . . . . . . . A-43
Program 9 . Common-Source Characteristics . . . . A-43
Program 10 . Transconductance . . . . . . . . . . . A-48