Program 6B . Current Gain (Fast Method - Keithley Series 2600 Application Manual

System sourcemeter instruments semiconductor device test
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APPenDIx A
Scripts
end --if
return l_comp_val
end --function Check_Comp()
--DC_Gain_Search()
Program 6B. Current Gain (Fast Method)
--[[
DC_Gain_Fast()
This program applies a bias to the collector/emitter of a BJT (Vce) and sweeps current on
the emitter (IE). The gain for each emitter value is then printed.
Required equipment:
(1) Dual-channel Keithley Series 2600 System SourceMeter instrument
(1) 2N5089 NPN Transistor
Running this script creates functions that can be used to measure the gain characteristics
of transistors. The default values are for an NPN transistor type 2N5089.
The functions created are:
1. DC_Gain_Fast(vcesource, istart, istop, isteps)
--Default values vcesource = 10V, istart = 1mA, istop = 10mA, isteps = 10
2. Print_Data(isteps, emitter_curr, base_curr)
See detailed information listed in individual functions.
1) From Test Script Builder
- At the TSP> prompt in the Instrument Control Panel, type DC_Gain_Fast()
2) From an external program
- Send the entire program text as a string using standard GPIB Write calls.
Rev1: JAC 6.11.2007
]]--
------------------ Keithley TSP Function ------------------
function DC_Gain_Fast(vcesource, istart, istop, isteps) --Configure SMUB to source a bias
voltage
--on the base and SMUA performs a current sweep on the emitter from start to stop in a
user-defined number of steps.
A-32

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