Keithley Series 2600 Application Manual page 4

Program 11 . Threshold . . . . . . . . . . . . . . . . A-52
Program 11A . Threshold (Search) . . . . . . . . . . A-52
Program 11B . Threshold (Fast) . . . . . . . . . . . . A-56
Section 5. Using Substrate Bias . . . . . . . . . . . . . . A-60
Program 12 . Substrate Current vs . Gate-Source
Voltage (FET I
Program 13 . Common-Source Characteristics
with Substrate Bias . . . . . . . . . . . . . A-64
Program 14 . Common-Emitter Characteristics
with Substrate Bias . . . . . . . . . . . . . . A-71
Section 6. High Power Tests . . . . . . . . . . . . . . . . A-78
Program 15 . High Current with
Voltage Measurement . . . . . . . . . . . . A-78
Program 16 . High Voltage with
Current Measurement . . . . . . . . . . . . A-80
vs . V ) . . . . . . . . . . . A-60
SB GS