With Substrate Bias - Keithley Series 2600 Application Manual

System sourcemeter instruments semiconductor device test
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APPenDIx A
Scripts
l_source_val = l_source_val + l_step --Calculate new source value
node[1].smub.source.levelv = l_source_val --Increment source
end--for
node[1].smua.source.output = node[1].smua.OUTPUT_OFF --Disable output
node[1].smub.source.output = node[1].smub.OUTPUT_OFF --Disable output
node[2].smua.source.output = node[2].smua.OUTPUT_OFF --Disable output
Print_Data(l_vgs_steps, l_id_curr, l_vgs_volt,l_isb_curr)
end--function Diode_Fwd_Chr()
function Print_Data(vgssteps,idcurr,vgsvolt,isbcurr)
--Print Data to output queue
--Local Variables
local l_vgs_steps = vgssteps
local l_id_curr = idcurr
local l_vgs_volt = vgsvolt
local l_isb_curr = isbcurr
print("Drain-source current(A):", "Gate-source voltage(V):", "Substrate-source
current(A):" )
for l_i = 1, l_vgs_steps
print(l_id_curr[l_i], l_vgs_volt[l_i], l_isb_curr[l_i])
end
end --function Print_Data()
--FET_Isb_Vgs()
Program 13. Common-Source Characteristics with Substrate Bias
--[[
FET_Comm_Source_Vsb():
This program applies a bias to the substrate-source of an FET (VSB) and a staircase sweep
on the gate-source voltage (VGS). At each VGS value, the drain-source voltage (VDS) is
also swept linearly.
At each point, the VDS and IDS are measured and printed.
Required equipment:
(1) Dual-channel Keithley Series 2600 System SourceMeter instrument
A-64
do

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