Program 11B . Threshold (Fast - Keithley Series 2600 Application Manual

System sourcemeter instruments semiconductor device test
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APPenDIx A
Scripts
local l_comp_val = false --Initialize local variable
l_comp_val = smua.source.compliance --Check compliance
if l_comp_val == true then
print("")
print("SMU Source in Compliance!")
print("Ensure proper connections, stable device, and settings are correct")
print("Rerun Test")
print("")
end --if
return l_comp_val
end --function Check_Comp()
--FET_Thres_Search()
Program 11B. Threshold (Fast)
--[[
FET_Thres_Fast()
This program applies a bias to the drain-source of an FET (VDS) and sweeps current on the
drain-source (ID) and the threshold voltage (VTH) at each ID value is measured.
*NOTE: Due to connection scheme, negative values are to be programmed for the sourced
values. The absolute value of the measurements and sourced values are printed.
Required equipment:
(1) Dual-channel Keithley Series 2600 System SourceMeter instrument
(1) SD210 N-channel FET
Running this script creates functions that can be used to measure the threshold of FETs.
The default values are for an N-channel FET type SD210.
The functions created are:
1. FET_Thres_Fast(vdssource, istart, istop, isteps)
--Default values vdssource = 0.5V, istart = 0.5uA, istop = 1uA, isteps =
10
2. Print_Data(isteps, drain_curr, thres_volt)
See detailed information listed in individual functions.
1) From Test Script Builder
- At the TSP> prompt in the Instrument Control Panel, type FET_Thres_Fast()
2) From an external program
A-56

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