Keithley Series 2600 Manuals

Manuals and User Guides for Keithley Series 2600. We have 1 Keithley Series 2600 manual available for free PDF download: Application Manual

Keithley Series 2600 Application Manual

Keithley Series 2600 Application Manual (136 pages)

System SourceMeter Instruments Semiconductor Device Test

Brand: Keithley | Category: Measuring Instruments | Size: 2 MB

Table of Contents

Table of Contents
2
List of Illustrations
6
Introduction

8
Hardware Configuration

8
Graphing

9
Introduction

10
- Section 2 Two-Terminal Device Tests
  10
Instrument Connections

10
Voltage Coefficient Tests of Resistors

10
Capacitor Leakage Test

12
- Test Configuration
  12
- Leakage Resistance Calculations
  12
- Figure 2-3. Test Configuration for Capacitor Leakage Test
  12
- Measurement Considerations
  13
- Example Program
  13
  - Capacitor Leakage Test
    13
- Typical Program 2 Results
  13
- Program 2 Description
  14
Diode Characterization

14
- Test Configuration
  14
- Measurement Considerations
  14
- Example Program 3
  
  14
Introduction

18
- Section 3 Bipolar Transistor Tests
  18
Instrument Connections

18
Common-Emitter Characteristics

19
- Typical Program 4 Results
  20
- Program 4 Description
  20
- Gummel Plot
  
  20
Current Gain

23
- Gain Calculations
  23
- Test Configuration for Search Method
  23
- Measurement Considerations
  23
- Example Program 6A: DC Current Gain Using Search Method
  23
- Figure 3-5 . Test Configuration for Current Gain Tests
  23
- Typical Program 6A Results
  24
- Program 6A Description
  24
- Modifying Program 6A
  24
- Configuration for Fast Current Gain Tests
  25
- Example Program 6B: DC Current Gain Using Fast Method
  25
- Figure 3-6. Test Configuration for Fast Current Gain Tests
  25
- Program 6B Description
  26
- Example Program 7: AC Current Gain
  26
- Typical Program 7 Results
  27
- Program 7 Description
  27
- Modifying Program 7
  27
- Transistor Leakage Current
  
  27
  - Test Configuration
    27
  - Example Program 8: I
    28
    
    Ceo
    28
    
    Figure 3-7. Configuration for I
    28
    
    Program 8 Description
    28
    
    Test
    28
    
    Typical Program 8 Results
    28
    
    Figure 3-8. Program 8 Results: I
    29
    
    Modifying Program 8
    29
Common-Source Characteristics

30
- Test Configuration
  30
- Example Program 9: Common-Source Characteristics
  30
- Typical Program 9 Results
  31
- Program 9 Description
  31
- Figure 4-1. Test Configuration for Common-Source Tests
  31
- Modifying Program 9
  32
- Section 4 FET Tests
  30
  - Introduction
    30
  - Instrument Connections
    30
Transconductance Tests

32
Threshold Tests

35
Introduction

40
- Section 5 Using Substrate Bias
  40
Substrate Bias Instrument Connections

40
5.3 Source-Measure Unit Substrate Biasing. . . . .5-2

41
BJT Substrate Biasing

46
Introduction

50
Instrument Connections

51
Appendix A Scripts

54
Section 2. Two-Terminal Devices

54
Section 3. Bipolar Transistor Tests

72
- Program 4. Common-Emitter Characteristics
  72
- Program 5. Gummel Plot
  77
Section 6. High Power Tests

81
Section 4. FET Tests

96
- Program 9. Common-Source Characteristics
  96
- Program 10. Transconductance
  101
- Program 11. Threshold
  105
- Program 11A . Threshold (Search
  105
- Program 11B . Threshold (Fast
  109
Section 5. Using Substrate Bias

113
- Program 12 . Substrate Current Vs . Gate-Source
  113
  - Sb Gs
    113
  - With Substrate Bias
    117
  - With Substrate Bias
    124
Section 6. High Power Tests

131
- Current Measurement
  133

Advertisement

Advertisement

Related Products

Keithley Categories

Measuring Instruments Multimeter Test Equipment

Power Supply

Switch

More Keithley Manuals