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SeCTIon 2
Two-terminal Device Tests
1 .
With the power off, connect the instrument to the computer's
IEEE-488 interface .
2 .
Connect the test fixture to the instrument using appropriate
cables .
3 .
Turn on the instrument, and allow the unit to warm up for
two hours for rated accuracy .
4 .
Turn on the computer and start Test Script Builder (TSB) . Once
the program has started, open a session by connecting to the
instrument . For details on how to use TSB, see the Series 2600
Reference Manual .
5 .
You can simply copy and paste the code from Appendix A in
this guide into the TSB script editing window
Diode Forward
Characterization), manually enter the code
from the appendix, or import the TSP file 'Diode_Fwd_Char .
tsp' after downloading it to your PC .
If your computer is currently connected to the Internet, you
can click on this link to begin downloading:
keithley.com/data?asset=50924.
6 .
Install a small-signal silicon diode such as a 1N914 or 1N4148
in the appropriate axial socket of the test fixture .
7 .
Now, we must send the code to the instrument . One method
is simply to right-click in the open script window of TSB, and
select 'Run as TSP file' . This will compile the code and place
it in the volatile run-time memory of the instrument . To store
the program in non-volatile memory, see the "TSP Program-
ming Fundamentals" section of the Series 2600 Reference
Manual .
8 .
Once the code has been placed in the instrument run-time
memory, we can run it at any time simply by calling the func-
tion 'Diode_Fwd_Char()' . This can be done by typing the text
'Diode _ Fwd _ Char()' after the active prompt in the
Instrument Console line of TSB .
9 .
In the program 'Diode_Fwd_Char . t sp', the function
Fwd _ Char(ilevel,
created . The variable ilevel represents the current value
applied to the device-under-test (DUT) both before and after
the staircase sweep has been applied . The start variable
represents the starting current value for the sweep, stop repre-
sents the end current value, and steps represents the number
of steps in the sweep . If any values are left blank, the function
will use the default value given to that variable, but you can
specify what voltage is applied by simply sending a voltage that
is in-range in the function call .
10 .
As an example, if you wanted to configure a test that would
source 0mA before and after the sweep, with a sweep start
value of 1mA, stop value of 10mA, and 10 steps, you would
2-6
(Program 3A,
http://www.
Diode _
steps) is
start,
stop,
Diode Forward Characteristics
9.00E–01
8.00E–01
7.00E–01
6.00E–01
5.00E–01
4.00E–01
3.00E–01
2.00E–01
1.00E–01
0.00E–00
0.00E+00
2.00E–03
Figure 2-6. Program 3 results: Diode forward
characteristics
simply send Diode _ Fwd _ Char(0, 0.001, 0.01,
10) to the instrument .
11 .
The instrument will then source the programmed current
staircase sweep and measure the respective voltage at each
step . The measured and sourced values are then printed to
the screen (if using TSB) . To graph the results, simply copy
and paste the data into a spreadsheet such as Microsoft Excel
and chart .
2.5.4 Typical Program 3 Results
Figure 2-6 shows typical results obtained using Example Program
3 . These results are for a 1N914 silicon diode .
2.5.5 Program 3 Description
At the start of the program, the instrument is reset to default con-
ditions, the error queue, and data storage buffers are cleared . The
following configuration is then applied before the data collection
begins:
•
Source I
•
Local sense
•
10V compliance, autorange measure
•
0A
Ilevel:
•
0 . 0 01A
start:
•
0 . 0 1A
stop:
•
10
steps:
The instrument then sources ilevel, dwells l _ delay sec-
onds, and begins the staircase sweep from start to stop in
steps . At each current step, both the current and voltage are
measured .
Voltage Data (V)
4.00E–03
6.00E–03
8.00E–03
Current (Amps)
1.00E–02
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