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6.1 Introduction
Many devices, such as LED arrays and power FETs, require large
current or voltage values for operation or characterization, which
can create issues when testing . While System SourceMeter instru-
ments are extremely flexible, they do have power limitations . For
example, a single SMU channel of a Model 2602 can deliver up to
40W of power . That translates to sourcing 1A at 40V or 40V at 1A .
What do we do if our device requires 2A at 40V?
Luckily, the answer is straightforward if we take certain precau-
tions .
The following examples illustrate how to configure a dual-channel
instrument, such as a Model 2602, 2612, or 2636, to deliver higher
current or voltage values .
6.1.1 Program 15 Test Configuration
Figure 6-1 shows the test configuration for Program 15 . SMUA
and SMUB outputs are wired in parallel: SMUA Output HI to
SMUB Output HI and SMUA Output LO to SMUB output LO . This
effectively doubles the maximum current output and can deliver
a total of 2A at 40V .
Output
Output
HI
LO
SMUB
Series 2600
System SourceMeter
Figure 6-1. High current (SMUs in parallel)
Section 6
High Power Tests
Output
Output
LO
HI
SMUA
DUT
In this example, local sense is being used to measure voltage, but
you can use remote sensing from one of the SMU channels if high
accuracy voltage measurements are required . See
for more information on remote sensing .
6.1.2 example Program 15: High Current
Source and Voltage Measure
Program 15 demonstrates how to deliver higher current sourcing
values using a dual-channel System SourceMeter instrument .
Follow these steps to use this program .
1 .
With the power off, connect the dual-channel Instrument to
the computer's IEEE-488 interface .
2 .
Connect the test fixture to both units using appropriate
cables .
3 .
Turn on the instrument and allow the unit to warm up for two
hours for rated accuracy .
4 .
Turn on the computer and start Test Script Builder (TSB) . Once
the program has started, open a session by connecting to the
instrument . For details on how to use TSB, see the Series 2600
Reference Manual .
5 .
. Y ou can simply copy and paste the code from Appendix A in
this guide into the TSB script editing window
manually enter the code from the appendix, or import the TSP
file 'KI2602Example_High_Current.tsp' after downloading it
to your PC .
If your computer is currently connected to the Internet, you
can click on this link to begin downloading:
keithley.com/data?asset=50965.
6 .
Install a device (Power FET, LED array, etc . ) in the appropriate
transistor socket of the test fixture .
7 .
Now, we must send the code to the instrument . The simplest
method is to right-click in the open script window of TSB,
and select 'Run as TSP file' . This will compile the code and
place it in the volatile run-time memory of the instrument .
To store the program in non-volatile memory, see the "TSP
Programming Fundamentals" section of the Series 2600 Refer-
ence Manual .
8 .
Once the code has been placed in the instrument run-time
memory, we can run it at any time simply by calling the
paragraph 1 .2 .2
(Program
15),
http://www.
6-1
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