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National Instruments 653X User Manual page 96

High-speed digital i/o devices for pci, pxi, compactpci, at, eisa, and pcmcia bus systems
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Note
Random vibration profiles were developed in accordance with MIL-T-28800E and
MIL-STD-810E Method 514. Test levels exceed those recommended in MIL-STD-810E
for Category 1 (Basic Transportation, Figures 514.4-1 through 514.4-3).
© National Instruments Corporation
Nonoperational random vibration
(PXI only) .............................................. 5 to 500 Hz, 2.5 g
A-5
Appendix A
Specifications
, 3 axes
rms
653X User Manual

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