Toshiba DP1600 Service Handbook page 42

(7) 07. CLOCK IC TEST
After programming the fixed data and time on the clock IC, the test reads the programmed data and time
and checks whether or not they are correct
<Key used in operation>
1 3
Power ON
07.CLOCK IC TEST
SET
Cancel
(8) 08. SCANNER TEST
The read/write test is performed on the RAM built in the image processing LSI.
<Key used in operation>
1 3
Power ON
08.SCANNER TEST
SET
Cancel
1600/2000/2500 ADJUSTMENT ITEMS
Select test menu
Select test menu
1 - 34
<Display messages>
FUNCTION TEST
05.SRAM TEST
06.DRAM TEST
07.CLOCK IC TEST
CLOCK IC TEST
OK
or
CLOCK IC TEST
NG
<Display messages>
FUNCTION TEST
06.DRAM TEST
07.CLOCK IC TEST
08.SCANNER TEST
SCANNER TEST
OK
or
SCANNER TEST
NG
December 2000 © TOSHIBA TEC