Table of Contents
Advertisement
1
Introducing the Agilent 85225F Performance Modeling System
The CV Subsystem
The Agilent 4284A precision LCR meter provides a wide 20 Hz to 1 MHz
test frequency range and superior test- signal performance, allowing CV
testing to the most commonly- used test standards, such as IEC/MIL, and
under conditions that simulate the intended application.
Optionally, the system can be configured with the Agilent E5250A low
leakage switch mainframe. The Agilent E5250A is used for precise
parametric test. It improves measurement efficiency by eliminating the
need to manually change the probe positions on a manual probe station.
The E5250A is used to route signals from the DC and CV subsystems to
the probe card cable, and on to the probe card and probe station.
Component Integration
System component integration is performed at the Agilent Technologies
factory. The individual components are placed into the rack, and the
required cabling is connected between the instruments.
After factory integration, the system is tested to verify functional
performance.
The Agilent 85225F performance modeling system includes the following
components, as shown in
• Agilent E8364B PNA Series vector network analyzer
• Agilent 4156C precision semiconductor parameter analyzer (or
• Agilent 11612V Option K11 bias network (port 1)
• Agilent 11612V Option K21 bias network (port 2)
• Agilent 4284A precision LCR meter
• Agilent 85133F flexible test port cable set
• Agilent E3661B 1.6 meter rack cabinet
• filler panels, feedthrough panels, work surface, cables, and adapters
System front panel connections are listed in
illustrated in
System rear panel connections are listed in
illustrated in
34
optionally Agilent E5260A or E5270B)
Figure 19
Figure 20
Figure 18
on page 49:
on page 51.
on page 53.
Table 10
on page 50 and
Table 11
on page 52 and
Installation and User's Guide
Advertisement
Table of Contents
