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1/f Noise, CV, RF, and DC Measurement System Configuration
With the addition of a dynamic signal analyzer and a precision LCR meter,
the Agilent 85225F performance modeling system measures the DC, RF,
CV, and 1/f noise performance of active and passive devices. The IC- CAP
software then extracts the device parameters and displays the results.
The Agilent 85225F performance modeling system is the integration of
rack- mounted RF and DC subsystems, a precision LCR meter, a dynamic
signal analyzer, bias networks, and a system controller, as shown in
Figure
Installation and User's Guide
Introducing the Agilent 85225F Performance Modeling System
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