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DC Subsystem Functional Verification Test
Understanding the DC Subsystem Functional Verification Test
Use this procedure to manually confirm the functionality of the DC
subsystem. The procedure provided in
Functional Verification
For Agilent 4156C subsystems:
• the internal operation of the Agilent 4156C precision semiconductor
For Agilent E5260A/70B DC subsystems:
• the operation of the Agilent E5260A/70B parametric measurement
• the operation of the plug- in source monitor units
This procedure runs a self- test initiated from the instrument's front panel.
The test includes a self- calibration routine to improve short- term
accuracy.
Required Tools
• Agilent 4156C precision semiconductor parameter analyzer,
• Agilent E5260A/70B parametric measurement mainframe
120
parameter analyzer
mainframe
"Performing the DC Subsystem
Test" confirms:
Installation and User's Guide
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