Appendix A, Specifications - Ametek 7230 Instruction Manual

Specifications
Measurement Modes
Signal Channel
X In-phase
Y Quadrature
R Magnitude

Phase Angle
Noise
Harmonic
Dual Harmonic
Dual Reference
Tandem Reference
Virtual Reference
Noise
Voltage Inputs
Modes
Frequency Response
Full-scale Sensitivity
Input Impedance
FET Input
Bipolar Input
Maximum Safe Input
Voltage Noise (typ)
FET Input
Bipolar Input
C.M.R.R.
Gain Accuracy
Distortion


The unit can simultaneously show any

four of these outputs on the front panel

display

nF, n  127
Simultaneously measures the signal at two different
harmonics F and F of the reference frequency
1 2
Simultaneously measures the signal at two different
reference frequencies, F
set to be derived from the internal and/or external
reference sources.
A variation of the Dual Reference mode, where the
signal is demodulated using the internal reference
frequency F , and the resulting X1 channel output is
1
passed to a second demodulator running at an external
reference frequency F
2
Locks to and detects a signal without a reference
(100 Hz  F  120 or 250 kHz)
Measures noise in a given bandwidth centered at the
reference frequency F
A only, -B only or Differential (A-B)
0.001 Hz  F  250 kHz
10 nV to 1 V in a 1-2-5 sequence (e.g. 10 nV,
20 nV, 50 nV)
10 M // 25 pF, AC or DC coupled
10 k // 25 pF, input must be DC coupled
±12.0 V
5 nV/Hz @ 1 kHz
2 nV/Hz @ 1 kHz
>100 dB @ 1 kHz degrading by no more than
6 dB/octave with increasing frequency
±1.0% typ, ±2.0% max.
–90 dB THD (60 dB AC gain, 1 kHz)
Appendix
and F , where F and F
1 2 1
A
can be
2
A-1