Test Subroutine Library Reference; Subroutine Descriptions; Beta1 - Keithley S530 User Manual

In this section:

Subroutine descriptions ............................................................ 3-1

Subroutine descriptions

beta1

This subroutine calculates the DC beta () of a test device at constant emitter current (I
(V ). The device is in the common-base configuration.
CB
Usage
double beta1(int e, int b, int c, int sub, double ie, double vcb, char type);
e
b
c
sub
ie
vcb
type
Returns
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the beta1 subroutine; this delay is the calculated time required for stable
forcing of emitter current with a 3 V voltage limit.

Test subroutine library reference

Input The emitter pin of the device
Input The base pin of the device
Input The collector pin of the device
Input The substrate pin of the device
Input The forced emitter current, in amperes
The forced c to b bias, in volts
Input
Type of transistor: "N" or "P"
Input
Output The calculated beta of the device:

-1.0 = TYPE not "N" or "P"

-2.0 = SMU2 overload
-3.0 = Divide by 0, or  < 0.01

-4.0 =  > 10 K or I


-5.0 = Emitter voltage limit reached; developed emitter voltage is
within 98 % of the 3 V voltage limit
) and collector-base bias
E
wrong sign
B
Section 3