Bkdn - Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual
Example
result = bice(e, b, c, sub, vce, vbe1, vbe2, vsub, npts, ice_last, &beta_last,
&beta_max, &ic_max);
Schematic

bkdn

This subroutine forces a current and measures breakdown voltage on a two-terminal device.
Usage
double bkdn(int hi, int lo, int sub, double ipgm, double vlim);
hi
lo
sub
ipgm
vlim
Returns
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the bkdn subroutine; this delay is the calculated time required for stable
forcing of ipgm within the vlim voltage limit.
Source-measure units (SMUs)

SMU1: Forces ipgm, programmable voltage limit, measures breakdown voltage
S530-907-01 Rev. A / September 2015
Input The HI pin of the device
Input The LO pin of the device
Input The substrate pin of the device
Input The forced current, in amperes
Input The voltage limit, in volts
Output The measured breakdown voltage:
+2.0E + 21 = Measured voltage is within 98 % of the specified voltage
limit
Section 3: Test subroutine library reference
3-9