Bice - Keithley S530 User Manual

Section 3: Test subroutine library reference

bice

This subroutine sweeps the emitter-base voltage (V
calculates beta ()at each value of V
configuration.
Usage
void bice(int e, int b, int c, int sub, double vce, double vbe1, double vbe2,
double vsub, int npts, double ice_last, double *beta_last, double *beta_max,
double *ic_max);
e
b
c
sub
vce
vbe1
vbe2
vsub
npts
ice_last
beta_last
beta_max
ic_max
Details
The collector-emitter voltage (V
In addition to the and I
maximum (ic_max) are returned.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
connected and forced.
V/I polarities
NPNs +V , +I
CE
PNPs -V , -I
CE
Source-measure units (SMUs)

SMU1: Forces V

SMU2: Sweeps V

SMU3: Forces V
3-8
for a bipolar transistor. The device is connected in the common-emitter
BE
Input The emitter pin of the device
Input The base pin of the device
Input The collector pin of the device
Input The substrate pin of the device
Input The forced collector-emitter voltage, in volts
Input
The start point of the V
Input
The end point of the V
Input Substrate bias, in volts
Input The number of points in the sweep
Output
The measured I
Output The calculated beta array
Output The maximum beta in the array
Output
The I
CE
) and the substrate voltage (V
CE
return arrays, the maximum (beta_max) and collector current at
CE
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
SUB
, and -V
BE SUB
, and -V
BE SUB
, maximum current limit, measures I
CE
, maximum current limit, measures I
BE
, default current limit
SUB
S530 Parametric Test System Test Subroutine Library User's Manual
), measures the resulting collector-emitter current (I
BE
sweep, in volts
BE
sweep, in volts
BE
array
CE
at maximum beta
SUB
CE
BE
) are held constant.
S530-907-01 Rev. A / September 2015
), and
CE