Iebo - Keithley S530 User Manual

Section 3: Test subroutine library reference
Example
result = idss(d, g, s, sub, vdss, idlim, f, &idsat, &vdsat)
Schematic

iebo

This subroutine measures the reverse-bias leakage current through the emitter-base diode of a bipolar transistor
with the base grounded and collector terminal floating.
Usage
double iebo(int e, int b, int c, int s, double vebo, double vsub)
e
b
c
sub
vebo
vsub
Returns
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
connected and forced.
V/I polarities
NPN +V and -V
EB
PNP -V and -V
EB
Source-measure units (SMUs)

SMU1: Forces vebo, 1 mA current limit, measures leakage current

SMU2: Forces vsub, default current limit
3-44
S530 Parametric Test System Test Subroutine Library User's Manual
Input The emitter pin of the device
Input The base pin of the device
Input The collector pin of the device
Input The substrate pin of the device
Input Emitter-base voltage, in volts
Input Substrate bias, in volts
Output Reverse-bias leakage current:

+4.0E+21 = Current limit reached, measured current is within
98 % of the 1 mA limit
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
SUB
SUB
SUB
S530-907-01 Rev. A / September 2015