Keithley S530 User Manual page 17

S530 Parametric Test System Test Subroutine Library User's Manual
Details
This subroutine is a revised version of the
searchi and trig functions to search I
This subroutine sets the current trigger on SMU1 at the specified I
until the trigger is set. The emitter current is then forced, the collector current measured, and  is
calculated.
The percent error (error) is calculated between the target I
returned.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
connected and forced.
V/I polarities
NPN +I
CE
PNP -I
CE
Source-measure units (SMUs)

SMU1: Forces V

SMU2: Forces 0.0 V, measures I

SMU3: Searches I

SMU4: Forces V
Example
result = beta2a(e, b, c, sub, ice, vcb, ie1, ie2, vsub, &icmeas, &ieout, &error);
Schematic
S530-907-01 Rev. A / September 2015
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
SUB
, +V , I -V
CB E, SUB
, -V , +I , -V
CB E SUB
, maximum current limit, triggers on I
CB
, 3 V voltage limit
E
, default current limit
SUB
beta2 (on page 3-3) subroutine that uses the LPTLib
until the target I is reached.
E CE
CE
CE
BE
Section 3: Test subroutine library reference
. The emitter current is searched
CE
and the final measured I
CE
and
3-5