Cap - Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual
Source-measure units (SMUs)

SMU1: Forces I
Example
result = bvebo(e, b, c, sub, ipgm, vlim, type);
Schematic

cap

This subroutine measures the capacitance of a two-terminal device.
Usage
double cap(int hi, int lo, int sub, double vbias);
hi
lo
sub
vbias
Returns
Details
This subroutine measures the capacitance of a two-terminal capacitor at a specified voltage. The
voltage is provided by the internal capacitance meter bias supply. The result is returned in farads.
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
When using this routine for junction capacitance measurements, make sure the junction never
becomes forward biased. To prevent this, make sure the forward voltage is less than one-half the
barrier potential (for silicon, this means that the forward voltage (V
350 mV).
At the onset of conduction in a forward-biased diode (V > 300 mV), the current flow causes
unpredictable readings in the capacitance meter (usually overrange, 10
S530-907-01 Rev. A / September 2015
, programmed voltage limit, measures bvebo
EBO
Input The HI pin of the device
Input The LO pin of the device
Input The substrate pin of the device
Input The voltage bias on the device, in volts
Output Measured capacitance
Section 3: Test subroutine library reference
) should not exceed 300 mV to
F
22
).
3-21