Fndtrg; Fvmi - Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual

fndtrg

This subroutine determines which native mode trigger to use.
Usage
int fndtrg(double low, double high)
low
high
Returns
Details
This subroutine compares the algebraic magnitudes of the input parameters and sets its return value
TRUE if TRIGL should be used or FALSE if TRIGH should be used.
Example
result = fndtrg(low, high)

fvmi

This primitive subroutine forces a voltage and measures a current on a device with four input pins and four ground
pins.
Usage
double fvmi(int h1, int h2, int h3, int h4, int l1, int l2, int l3, int l4, double
v, double *i);
h1
h2
h3
h4
l1
l2
l3
l4
v
i
Returns
Details
This subroutine is normally used for defect structures with multiple high pins and ground pins.
S530-907-01 Rev. A / September 2015
Input The low value
Input The high value
TRUE = Use the Less Than trigger
Output
FALSE = Use the Greater Than trigger
Input HI pin 1
Input HI pin 2
Input HI pin 3
Input HI pin 4
Input LO pin 1
Input LO pin 2
Input LO pin 3
Input LO pin 4
Input Forced voltage, in volts
Output Measured current
Output Measured current:

0.0 = All high or low pins are < 1

+4.0E+21 = Measured voltage is within 98 % of the default current
limit
Section 3: Test subroutine library reference
3-29