Fimv - Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual

fimv

This subroutine forces a current and measures a voltage on a device with four high (source) pins and four ground
pins. This is an alternate version of the fvmi subroutine.
Usage
double fimv(int h1, int h2, int h3, int h4, int l1, int l2, int l3, int l4, double
*v, double i);
h1
h2
h3
h4
l1
l2
l3
l4
v
i
Returns
Details
Input a -1 if the pin is not to be used.
A delay is incorporated into the fimv subroutine; this delay is the calculated time required for stable
forcing of i with a 30 V voltage limit (default).
Source-measure units (SMUs)

SMU1: Forces current, default voltage limit, measures voltage
Example
result = fimv(h1, h2, h3, h4, l1, l2, l3, l4, &v, i);
Schematic
S530-907-01 Rev. A / September 2015
Input HI pin 1
Input HI pin 2
Input HI pin 3
Input HI pin 4
Input LO pin 1
Input LO pin 2
Input LO pin 3
Input LO pin 4
Output Measured voltage
Input Forced current, in amperes
Output Measured voltage:
0.0 = All high or low pins are <1
Figure 7: Schematic for the fimv subroutine
Section 3: Test subroutine library reference
3-27