Vg2 - Keithley S530 User Manual

Section 3: Test subroutine library reference
Example
result = vf(hi, lo, sub, itest)
Schematic

vg2

This subroutine measures gate-source voltage (V
substrate bias (V ).
BS
Usage
double vg2(int d, int g, int s, int sub, char type, double idspec, double errpct,
double vds, double vbs, double vglo, double vghi, int maxitr, double *idmeas,
int *istat)
d
g
s
sub
type
idspec
errpct
vds
vbs
vglo
vghi
maxitr
idmeas
istat
Returns
3-64
S530 Parametric Test System Test Subroutine Library User's Manual
) at a specified drain current (I
GS
Input The drain pin of the device
Input The gate pin of the device
Input The source pin of the device
Input The substrate pin of the device
Type of transistor: "N" or "P"
Input
Input
Target value of I
DS
Input Maximum percent error in drain current
Input The forced drain voltage, in volts
Input The forced substrate bias, in volts
Input
Start of the gate-source voltage (V
Input
End of the V search, in volts
GS
Input Maximum number of iterations
Output
Final measured I
DS
Output Return status code:

> 0 = Success, istat is the number of iterations

-1 = type not "N" or "P"
-2 = vglo is  vghi


-3 = Maximum iteration count reached

-4 = I window too small
DS

-5 = maxitr < 0
Measured gate-source voltage, or 0.0 if istat is < 0
Output
), drain voltage (V
DS
, in amperes
) search, in volts
GS
, in amperes
S530-907-01 Rev. A / September 2015
), and
DS