Agilent Technologies 33250A User Manual page 270

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Chapter 5 Error Messages
Self-Test Errors
Self-test failed; primary phase locked loop
This error indicates that the primary PLL (U901, U903) has failed to lock.
Self-test failed; secondary phase locked loop at 200 MHz
This error indicates that the secondary PLL (U904-U907), which is used
for the pulse function, has failed to lock at 200 MHz.
Self-test failed; secondary phase locked loop at 100 MHz
This error indicates that the secondary PLL (U904-U907), which is used
for the pulse function, has failed to lock at 100 MHz.
618: Self-test failed; display contrast DAC
619: Self-test failed; leading edge DAC
620: Self-test failed; trailing edge DAC
621: Self-test failed; square-wave threshold DAC
622: Self-test failed; time base calibration DAC
623: Self-test failed; dc offset DAC
624: Self-test failed; null DAC
625: Self-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC (U701-U705),
DAC MUX logic circuit, or DAC MUX (U706-U708, U603) channels.
These self-tests use the internal ADC to verify that the system DAC's are
operating properly. For each DAC, the readings are taken at 25%, 50%,
and 75% of full scale.
626: Self-test failed; analog-digital path select relay
627: Self-test failed; -10 dB attenuator path
628: Self-test failed; -20 dB attenuator path
629: Self-test failed; +20 dB amplifier path
These errors indicate that the specified relay is not being properly
switched or the attenuator/amplifier is not providing the expected
attenuation or gain. These self-tests use the internal ADC to verify that
the output path relays, output amplifier hybrid (+20 dB), and output
attenuators are operating properly.
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