Step 2: Re-Registering Reference Values - Omron F160 Operation Manual

Surface Defects
3-6-2

STEP 2: Re-registering Reference Values

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Position detection can also be performed using algorithms for detecting
defects. When a measurement region is drawn, measurement is performed for
the displayed image and the results are registered as the reference values (X
and Y coordinates of the position where the defect was found). If this function
is used, however, the reference value alone can be re-registered based on the
currently displayed image.
Example: Inspecting whether or not the measurement object is always in
the same position
Display a measurement object in the correct position, detect a mark, and reg-
ister that position as the reference position.
Register the detected mark as the reference position.
The reference value can be changed to enable the following function.
Inspecting Positions from a Specified Point
Once a mark has been detected in the image currently displayed, the refer-
ence position is changed to an suitable point. Position inspection can be per-
formed by calculating the difference between this reference position and the
measurement position.
Reference position (changed to a suitable point)
If the measurement region is changed, the reference values return to the
default setting.
1. Select Reference registration.
0.Defect
Region
Reference registration
Judgement conditions
Detailed conditions
Coordinate mode
Measurement position
(mark detected as a defect)
Section 3-6