Leakage Current Measurement - Agilent Technologies B1500A User Manual

Semiconductor device analyzer
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Table 4-13

Leakage Current Measurement

Table 4-13 explains an example subprogram that performs the quasi pulsed spot
measurement and displays the measurement result data (MOSFET drain current).
Leakage Current Measurement Example
void perform_meas (ViSession vi, ViStatus ret)
{
ViInt32
drain =
ViInt32
gate =
ViInt32
source =
ViInt32
bulk =
ViReal64
vd =
ViReal64
vg =
ViReal64
idcomp =
ViReal64
igcomp =
ViReal64
start =
ViReal64
hold =
ViReal64
delay =
ViReal64
meas;
ViInt32
status;
ret = agb1500_setSwitch(vi, drain, 1);
ret = agb1500_setSwitch(vi, gate, 1);
ret = agb1500_setSwitch(vi, source, 1);
ret = agb1500_setSwitch(vi, bulk, 1);
check_err (vi, ret);
ret = agb1500_force(vi, bulk, agb1500_VF_MODE, 0, 0, 0.1, 0);
ret = agb1500_force(vi, source, agb1500_VF_MODE, 0, 0, 0.1, 0);
ret = agb1500_force(vi, gate, agb1500_VF_MODE, 0, vg, igcomp,
0);
check_err (vi, ret);
Line
1
Beginning of the perform_meas subprogram.
4 to 16
Declares variables, and defines the value.
18 to 21
Enables measurement channels.
24 to 26
Applies voltage to device.
22 and 27
Calls the check_err subprogram (shown in Table 4-1) to check if
an error status is returned for the previous line.
Agilent B1500 VXIplug&play Driver User's Guide, Edition 3
Programming Examples for C++ Users
Leakage Current Measurement
1;
/* SMU1, drain */
2;
/* SMU2, gate */
4;
/* SMU4, source */
6;
/* SMU6, bulk */
5;
0;
0.05;
0.01;
-5;
0.1;
0.001;
Description
/* 1 */
/* 16 */
/* 18 */
/* 22 */
/* 27 */
4-39

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