Sampling Measurement - Agilent Technologies B1500A User Manual

Semiconductor device analyzer
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Table 4-14
void perform_meas (ViSession vi, ViStatus ret)
{
ViInt32
t1 =3;
ViInt32
t2 =4;
ViInt32
low =1;
ViReal64
base =0;
ViReal64
bias =0.1;
ViReal64
icomp =0.1;
ViReal64
vlout =0;
ViReal64
ilcomp =0.1;
ViReal64
base_h =0;
ViReal64
bias_h =0.1;
ViReal64
interval =0.05;
ViInt32
nop =30;
ViInt32
mch[3];
ViInt32
mode[2];
ViReal64
range[2];
ViInt32
point;
ViInt32
index[30];
ViReal64
value[60];
ViInt32
status[60];
mch[0]
=t1;
mch[1]
=t2;
mch[2]
=0;
mode[0]
=1;
mode[1]
=1;
range[0]
=0;
range[1]
=0;
Line
1
Beginning of the perform_meas subprogram.
3 to 28
Declares variables, and defines the value.

Sampling Measurement

Table 4-14 explains example subprogram that performs sampling measurement.
This example measures current that flows to resistors R1 and R2, and then calculates
the resistance.
Sampling Measurement Example
/* SMU3 */
/* SMU4 */
/* SMU1 */
Agilent B1500 VXIplug&play Driver User's Guide, Edition 3
Programming Examples for C++ Users
Description
Sampling Measurement
/* 1 */
/* 28 */
4-41

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