Multi Channel Sweep Measurement - Agilent Technologies B1500A User Manual

Semiconductor device analyzer
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Table 4-8

Multi Channel Sweep Measurement

Table 4-8 explains an example subprogram that performs the multi channel sweep
measurement. The following subprogram performs I-V measurement and saves the
measurement results (bipolar transistor Ic-Vb and Ib-Vb characteristics) into a file.
Multi Channel Sweep Measurement Example 1
void perform_meas (ViSession vi, ViStatus ret)
{
ViInt32
emitter =
ViInt32
base =
ViInt32
collector = 4;
ViReal64
vb1 =
ViReal64
vb2 =
ViReal64
vc =
ViReal64
ve =
ViReal64
ibcomp =
ViReal64
iccomp =
ViReal64
iecomp =
ViReal64
pcomp =
ViInt32
nop =
ViReal64
hold =
ViReal64
delay =
ViReal64
s_delay =
ViReal64
p_comp =
ViInt32
smpl =
ViInt32
mch[3];
ViInt32
mode[2];
ViReal64
range[2];
ViInt32
rep;
ViReal64
sc[11];
ViReal64
md[22];
ViInt32
st[22];
ViReal64
tm[22];
mch[0] =
collector;
mch[1] =
base;
mch[2] =
0;
mode[0] =
1;
mode[1] =
1;
range[0] = 0;
range[1] = 0;
Line
1
Beginning of the perform_meas subprogram.
3 to 34
Declares variables, and defines the value.
Agilent B1500 VXIplug&play Driver User's Guide, Edition 3
Programming Examples for C++ Users
Multi Channel Sweep Measurement
1;
/* SMU1 */
2;
/* SMU2 */
/* SMU4 */
0.3;
0.8;
3;
0;
0.01;
0.1;
0.1;
0;
11;
0;
0;
0;
0;
5;
Description
/* 1 */
/* 3 */
/* 34 */
4-23

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