Leakage Current Measurement; Programming Examples For C++ Users - Agilent Technologies B1500A User Manual

Semiconductor device analyzer
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NOTE
NOTE

Programming Examples for C++ Users

This chapter explains programming examples to perform the following
measurements using the Agilent B1500 and the B1500 VXIplug&play driver, and
consists of the following sections.
"Programming Basics"
"High Speed Spot Measurement"
"Multi Channel Spot Measurement"
"Pulsed Spot Measurement"
"Staircase Sweep Measurement"
"Multi Channel Sweep Measurement"
"Pulsed Sweep Measurement"
"Staircase Sweep with Pulsed Bias Measurement"
"Breakdown Voltage Measurement"

"Leakage Current Measurement"

"Sampling Measurement"
"High Speed Spot C Measurement"
"CV Sweep Measurement"
About Program Code
Programming examples are provided as a subprogram that can be run with the
project template shown in Table 4-1. To execute the program, insert the subprogram
instead of the perform_meas subprogram in the template.
To Start Program
If you create the measurement program by modifying the example code shown in
Table 4-1, the program can be run by clicking the Run button on the Visual C++
Main window.
4-2
Agilent B1500 VXIplug&play Driver User's Guide, Edition 3

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