High Speed Spot Measurement; Check_Err Vi, Ret - Agilent Technologies B1500A User Manual

Semiconductor device analyzer
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Table 4-2

High Speed Spot Measurement

Table 4-2 explains an example subprogram that performs the high speed spot
measurement. The following subprogram will apply voltage to a MOSFET, measure
drain current, and display the measurement result data.
High Speed Spot Measurement Example
void perform_meas (ViSession vi, ViStatus ret)
{
ViInt32
drain;
ViInt32
gate;
ViInt32
source;
ViInt32
bulk;
drain =
1;
/* SMU1 */
gate =
2;
/* SMU2 */
source =
4;
/* SMU4 */
bulk =
6;
/* SMU6 */
ret = agb1500_setSwitch(vi, drain, 1);
ret = agb1500_setSwitch(vi, gate, 1);
ret = agb1500_setSwitch(vi, source, 1);
ret = agb1500_setSwitch(vi, bulk, 1);
check_err (vi, ret);
ViReal64
vd;
ViReal64
vg;
ViReal64
idcomp;
ViReal64
igcomp;
ViReal64
meas;
ViInt32
status;
vd =
1.5;
idcomp =
0.05;
vg =
1.5;
igcomp =
0.01;
Line
1
Beginning of the perform_meas subprogram.
3 to 11
Declares variables, and defines the value.
13 to 16
Enables measurement channels.
17
Calls the check_err subprogram (shown in Table 4-1) to check if
an error status is returned for the previous line.
19 to 29
Declares variables, and defines the value.
Agilent B1500 VXIplug&play Driver User's Guide, Edition 3
Programming Examples for C++ Users
High Speed Spot Measurement
Description
/* 1 */
/* 3 */
/* 11 */
/* 13 */
/* 17 */
/* 19 */
/* 29 */
4-7

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