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Electrical Specifications
7.7
Test Access Port (TAP) Connection
Due to the voltage levels supported by other components in the Test Access Port (TAP)
logic, Intel recommends the processor be first in the TAP chain, followed by any other
components within the system. A translation buffer should be used to connect to the
rest of the chain unless one of the other components is capable of accepting an input of
the appropriate voltage. Two copies of each signal may be required with each driving a
different voltage level.
7.8
Absolute Maximum and Minimum Ratings
Table 7-4
functional operation condition limits, but within absolute maximum and minimum
ratings, neither functionality nor long-term reliability can be expected. If a device is
returned to conditions within functional operation limits after having been subjected to
conditions outside these limits (but within the absolute maximum and minimum
ratings) the device may be functional, but with its lifetime degraded depending on
exposure to conditions exceeding the functional operation condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality
nor long-term reliability can be expected. Moreover, if a device is subjected to these
conditions for any length of time, it will either not function or its reliability will be
severely degraded when returned to conditions within the functional operating
condition limits.
Although the processor contains protective circuitry to resist damage from Electro-
Static Discharge (ESD), precautions should always be taken to avoid high static
voltages or electric fields.
Table 7-4.
Processor Absolute Minimum and Maximum Ratings
Symbol
V
CC
V
TT
V
DDQ
V
CCPLL
T
STORAGE
Notes:
1.
For functional operation, all processor electrical, signal quality, mechanical and thermal specifications must
be satisfied.
2.
Excessive overshoot or undershoot on any signal will likely result in permanent damage to the processor.
3.
Storage temperature is applicable to storage conditions only. In this scenario, the processor must not
receive a clock, and no lands can be connected to a voltage bias. Storage within these limits will not affect
the long-term reliability of the device. For functional operation, refer to the processor case temperature
specifications.
4.
This rating applies to the processor and does not include any tray or packaging.
5.
Failure to adhere to this specification can affect the long-term reliability of the processor.
6.
V
is a VID based rail.
CC
Datasheet, Volume 1
specifies absolute maximum and minimum ratings. At conditions outside
Parameter
Processor Core voltage with respect
to V
SS
Voltage for the memory controller
and Shared Cache with respect to V
Processor I/O supply voltage for
DDR3 with respect to V
SS
Processor PLL voltage with respect to
V
SS
Storage temperature
Min
Max
-0.3
1.40
-0.3
1.40
SS
-0.3
1.80
-0.3
1.98
-40
85
1, 2
Unit
Notes
V
6
V
V
V
C
3, 4, 5
69
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