ELECTRICAL DATA
°
= − 25
(T
C to + 85
A
Oscillator
Crystal
External clock
XT
IN
17-12
Table 17-11. Sub Oscillation Stabilization Time
°
C, V
= 2.0 V to 3.6 V)
DD
Test Condition
–
XT
input high and low width (t
IN
t
XTL
Figure 17-8. Clock Timing Measurement at XT
S3C8275X/F8275X/C8278X/F8278X/C8274X/F8274X
Min
−
, t
)
5
XH
XL
1/fxt
t
XTH
V
-0.1 V
DD
0.1 V
Typ
Max
−
10
−
15
IN
Unit
s
µs