Memory Characteristics
Symbol
Parameter
V
Read / Write Operating Voltage
DD
Flash Program / Data EEPROM Memory
t
Write Cycle Time – Data EEPROM Memory
DEW
Cell Endurance – Flash Program Memory
E
P
Cell Endurance – Data EEPROM Memory
t
ROM Data Retention Time
RETD
RAM Data Memory
V
RAM Data Retention Voltage
DR
LVR/LVD Electrical Characteristics
Symbol
Parameter
V
Low Voltage Reset Voltage
LVR
V
Low Voltage Detection Voltage
LVD
I
Operating Current
LVRLVDBG
t
LVDO Stable Time
LVDS
t
Minimum Low Voltage Width to Reset
LVR
t
Minimum Low Voltage Width to Interrupt —
LVD
I
Additional Current for LVR Enable
LVR
Rev. 1.11
BS66F340C/BS66F350C/BS66F360C
Touch A/D Flash MCU
Ta=-40°C~85°C, unless otherwise specified.
Test Conditions
V
Conditions
DD
—
—
—
—
—
—
—
—
— Ta=25°C
— Device in SLEEP Mode
Test Conditions
V
Conditions
DD
— LVR enable, voltage select 2.1V
— LVR enable, voltage select 2.55V
— LVR enable, voltage select 3.15V
— LVR enable, voltage select 3.8V
— LVD enable, voltage select 2.0V
— LVD enable, voltage select 2.2V
— LVD enable, voltage select 2.4V
— LVD enable, voltage select 2.7V
— LVD enable, voltage select 3.0V
— LVD enable, voltage select 3.3V
— LVD enable, voltage select 3.6V
— LVD enable, voltage select 4.0V
3V LVD enable, LVR enable,
VBGEN=0
5V
3V LVD enable, LVR enable,
VBGEN=1
5V
For LVR enable, VBGEN=0,
—
LVD off → on
—
—
—
— LVD disable, VBGEN=0
30
Min.
Typ.
Max.
Unit
V
—
V
V
DDmin
DDmax
—
4
6
ms
10K
—
—
E/W
100K
—
—
E/W
—
40
—
Year
1.0
—
—
V
Ta=-40°C~85°C
Min. Typ. Max. Unit
2.1
2.55
-5%
+5%
V
3.15
3.8
2.0
2.2
2.4
2.7
-5%
+5%
V
3.0
3.3
3.6
4.0
—
—
18
μA
—
20
25
—
—
150
μA
—
180
200
—
—
18
μs
120
240
480
μs
60
120
240
μs
—
—
24
μA
November 09, 2023
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