Testing Performance
Performance Test Record (logic analyzer)
Performance Test Record (continued)
Test
Seltings
Results
Threshold Accuracy (coni)
Limits
Measured
Pod 4
TTL, ±145 mV
TTlVl
+1.355 V
TTlVH
+1.645 V
ECL, ±139 mV
ECl Vl
-1.439 V
EClVH
-1.161 V
-User, ±280 mV
-User Vl
-6.280V
- User VH
-5.720 V
+User, ±280 mV
+ User Vl
+5.720 V
+ UserVH
+6.280 V
o
V,±100 mV
o
VUserVl
-100 mV
o
VUserVH
+100 mV
Pod 5
TTL, ±145 mV
TTlVl
+1.355 V
TTlVH
+1.645 V
ECL,±139 mV
ECl Vl
-1.439 V
EClVH
-1.161 V
-User, ±280 mV
-UserVl
-6.280 V
- UserVH
-5.720 V
+User, ±280 mV
+ User Vl
+5.720 V
+ User VH
+6.280 V
OV,±100 mV
OVUserVl
-100 mV
o
VUserVH
+100 mV
Pod 6
TTL, ±145 mV
TTlVl
+1.355 V
TTlVH
+1.645 V
ECL, ±139 mV
EClVl
-1.439 V
EClVH
-1.161 V
-User, ±280 mV
-User Vl
-6.280 V
- User VH
-5.720 V
+User, ±280 mV
+ UserVl
+5.720 V
+ UserVH
+6.280 V
o
V,±100 mV
OVUserVl
-100 mV
OVUserVH
+100 mV
Pod 7
TTL, ±145 mV
TTlVl
+1.355 V
TTlVH
+1.645 V
ECL, ±139 mV
ECl Vl
-1.439 V
EClVH
-1.161 V
-User, ±280 mV
-UserVl
-6.280 V
- User VH
-5.720 V
+User, ±280 mV
+ User Vl
+5.720 V
+ User VH
+6.280 V
OV,±100 mV
o
VUserVl
-lOOmV
o
VUserVH
+100 mV
Pod 8
TTL, ±145 mV
TTlVl
+1.355 V
TTlVH
+1.645 V
ECL, ±139 mV
ECl Vl
-1.439 V
ECl VH
-1.161 V
-User, ±280 mV
-User Vl
-6.280 V
- UserVH
-5.720 V
+User, ±280 mV
+ UserVl
+5.720 V
+ User VH
+6.280 V
OV, ±100 mV
OVUserVl
-100 mV
o
VUserVH
+100 mV
3-96