About Testing - JDS Uniphase HST-3000 User Manual

Chapter 2 E1 testing

About testing

About testing

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The HST-3000, with an E1-capable SIM, is intended to be
used to commission and maintain E1 circuits. Typically this
involves out-of-service testing to ensure that the physical
layer is clean and there are no problems with network equip-
ment or improper provisioning.
You can use the HST-3000 in the following ways:
– To terminate a circuit, and then loop back to another
HST-3000 unit or piece of network equipment to perform
BER testing.
– To perform BER analysis end-to-end between two
HST-3000 units (typically requires two technicians) with
analysis performed in both directions. This allows you to
easily isolate faults on the circuit.
– To passively monitor one or two E1 circuits (in-service
testing) by examining transmission layer metrics such as
CRC and frame errors or timing slips.
– To perform drop-and-insert (D&I) BER testing on indi-
vidual timeslots within an E1 circuit.
– To perform line loopback testing to monitor the circuit.
HST-3000 E1 testing applications include the following
features:
– Standard E1 transmit (Tx) and receive (Rx) interfaces.
– Analysis for contiguous and non-contiguous timeslots in
64 kbit/s format.
– Supported framing formats: PCM30C, PCM30, PCM31C,
PCM31, and unframed.
– Insertion of code errors, bit errors, frame errors, TSE (bit
errors), CRC, E-bit errors, CRC, and MFAS errors.
– "All Summary Results OK" message is displayed if no
errors or alarms have occurred during the test. This
provides a quick and easy way of determining that the line
is free from errors.
HST-3000 E1 Testing User's Guide