Pulse Source-Measure Concepts - Keithley 4200A-SCS User Manual

Model 4200A-SCS Pulse Card (PGU and PMU) User's Manual
4200A-SCS power requirements for valid combinations of internal system instruments
Idle power
nPMU nRPM
5 10
5 10
6 12
6 12
6 12
6 12
The power limit check is performed in both ITMs and UTMs. In ITMs, exceeding the power limit will
display a message similar to the one shown in the following figure when configuring PMU.
For UTMs, the message appears in the Clarius Messages pane.

Pulse source-measure concepts

Ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many
technologies, including compound semiconductors, medium-power devices, nonvolatile memory,
microelectromechanical systems (MEMs), nanodevices, solar cells, and CMOS devices. Using pulsed
I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the
effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due
to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra
high-speed current or voltage waveforms in the time domain or to study dynamic test circuits. Pulsed
sourcing can be used to stress test a device using an AC signal during reliability cycling or in a
multi-level waveform mode to program or erase memory devices. The 4225-PMU Ultra-Fast I-V
Module for the 4200A-SCS supports many of these high-speed sourcing and measurement
applications.
4200A-PMU-900-01 Rev. A December 2020
Power used in test
nC10 nC40 nHPSMU
0 2 1
0 2 2
12 0 0
12 0 1
0 2 0
0 1 1
Figure 81: ITM maximum power exceeded message
Section 4: Pulse card concepts
PowerIDLE PowerTEST
294 154.2
294 199.2
352.8 218.4
352.8 263.4
352.8 308.4
352.8 123.6
PowerTOTAL
448.2
493.2
336
381
426
241.2
4-7