I/O Sampling Commands; Ic (Dio Change Detect) - Digi DigiMesh XBee S2C User Manual

AT commands
Parameter range
0 - 0x1770 (x 100 ms)
Default
0xFF

I/O sampling commands

The following AT commands configure I/O sampling parameters.

IC (DIO Change Detect)

Set or read the digital I/O pins to monitor for changes in the I/O state.
IC works with the individual pin configuration commands (D0 - D9, P0 - P2). If you enable a pin as a
digital I/O, use the IC command to force an immediate I/O sample transmission when the DIO state
changes. If sleep is enabled, the edge transition must occur during a wake period to trigger a change
detect.
The data transmission contains only DIO data.
IC is a bitmask you can use to enable or disable edge detection on individual digital I/O lines. Only
DIO0 through DIO12 can be sampled using a Change Detect.
Set unused bits to 0.
Bit I/O line
0 DIO0
1 DIO1
2 DIO2
3 DIO3
4 DIO4
5 DIO5
6 DIO6
7 DIO7
8 DIO8
9 DIO9
10 DIO10
11 DIO11
12 DIO12
Parameter range
0 - 0x1FFF
Default
0
XBee S2C DigiMesh 2.4 User Guide
Surface-mount pin
33
32
31
30
24
28
29
25
10
26
7
8
5
I/O sampling commands
Through-hole pin
20
19
18
17
11
15
16
12
9
13
6
7
4
106