Keysight Technologies B1500A Self-Paced Training Manual page 153

Module 5
SPGU Control and Applications
The pulse switch is the built-in high speed analog switch to open/close the SPGU output for each
channel. This switch is used in the write/erase cycle of the NOR type flash memory cell test. This
dramatically improves throughput of the endurance test (write/erase lifetime reliability test). The
SPGU channel can output the drain pulse for the write operation and make the open status for the
erase operation in one pulse period.
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