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Keysight Technologies B1500A Self-Paced Training Manual page 127

Semiconductor device analyzer
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Module 3
Low Current Measurement
A 3 second delay at the beginning of the measurement will be required. The SMU must initially step
from 0 to -5 V, a very large step. Fully guarded probes to within 2 mm of probe tip and fully guarded
chuck eliminated the need for delays at every measurement point. The only wait will be the initial 3
second hold time.
3-37

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